Ptychographic imaging for the characterization of X-ray free-electron laser beams

Sala, S; Daurer, BJ; Hantke, MF; Ekeberg, T; Loh, ND; Maia, FRNC; Thibault, P; (2017) Ptychographic imaging for the characterization of X-ray free-electron laser beams. Journal of Physics: Conference Series , 849 (1) , Article 012032. 10.1088/1742-6596/849/1/012032 . Green open access

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