At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis

Zdora, M-C; Zanette, I; Zhou, T; Koch, FJ; Romell, J; Sala, S; Last, A; ... Thibault, P; + view all Zdora, M-C; Zanette, I; Zhou, T; Koch, FJ; Romell, J; Sala, S; Last, A; Ohishi, Y; Hirao, N; Rau, C; Thibault, P; - view fewer (2018) At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis. Optics Express , 26 (4) pp. 4989-5004. 10.1364/OE.26.004989 . Green open access

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