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Τετάρτη 26 Ιουνίου 2019

Developments in X-ray tomography characterization for electrochemical devices
Publication date: Available online 24 June 2019Source: Materials TodayAuthor(s): Thomas M.M. Heenan, Chun Tan, Jennifer Hack, Dan J.L. Brett, Paul R. ShearingAbstractOver the last century, X-ray imaging instruments and their accompanying tomographic reconstruction algorithms have developed considerably. With improved tomogram quality and resolution, voxel sizes down to tens of nanometers can now be achieved. Moreover, recent advancements in readily accessible lab-based X-ray computed tomography (X-ray...
ScienceDirect Publication: Materials Today
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