Front Cover: In situ non-destructive measurement of biofilm thickness and topology in an interferometric optical microscope (J. Biophotonics 6/2016)

The cover picture shows a biofilm imaged using a new technique that utilizes white light interferometry (WLI). WLI is an established surface metrology technique that has not been previously used to image biofilms and we present the first images of biofilm growth using this nondestructive method. WLI produces a 3D topographical map of the biofilm with nanometer vertical resolution that will enable detailed studies of biofilm features and growth rates.

Further details can be found in the article by Curtis Larimer et al. on pp. 656–666.

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