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Δευτέρα 24 Οκτωβρίου 2016

Composition measurement of epitaxial ScxGa1-xN films

Tsui, HCL; Goff, LE; Barradas, NP; Alves, E; Pereira, S; Palgrave, RG; Davies, RJ; Tsui, HCL; Goff, LE; Barradas, NP; Alves, E; Pereira, S; Palgrave, RG; Davies, RJ; Beere, HE; Farrer, I; Ritchie, DA; Moram, MA; - view fewer (2016) Composition measurement of epitaxial ScxGa1-xN films. Semiconductor Science and Technology , 31 (6) , Article 064002. 10.1088/0268-1242/31/6/064002 .

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