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Τρίτη 2 Μαΐου 2017

Microstructural modifications in tungsten induced by high flux plasma exposure: TEM examination

We have performed microstructural characterization using transmission electron microscopy (TEM) techniques to reveal nanometric features in the sub-surface region of tungsten samples exposed to high flux, low energy deuterium plasma. TEM examination revealed formation of a dense dislocation network and dislocation tangles, overall resulting in a strong increase in the dislocation density by at least one order of magnitude as compared to the initial one. Plasma-induced dislocation microstructure vanishes beyond a depth of about 10 mu m from the top of the exposed surface where the dislocation density and its morphology becomes comparable to the reference microstructure. Interstitial edge dislocation loops with Burgers vector a(0)/2 < 111 > and a(0) < 100 > were regularly observed within 6 mu m of the sub-surface region of the exposed samples, but absent in the reference material. The presence of these loops points to a co-existence of nanometric D bubbles, growing by loop punching mechanism, and sub-micron deuterium flakes, resulting in the formation of surface blisters, also observed here by scanning electron microscopy.

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