Revealing silicon crystal defects by conductive atomic force microscope

Liu, X; Yu, B; Zou, Y; Zhou, C; Li, X; Wu, J; Liu, H; ... Qian, L; + view all Liu, X; Yu, B; Zou, Y; Zhou, C; Li, X; Wu, J; Liu, H; Chen, L; Qian, L; - view fewer (2018) Revealing silicon crystal defects by conductive atomic force microscope. Applied Physics Letters , 113 (10) , Article 101601. 10.1063/1.5044518 .

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